METHOD AND DEVICE FOR TESTING EPROM TYPE SEMICONDUCTOR DEVICE DURING BURN-IN,申请号JP19870182109-传众专利搜索

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发明名称	METHOD AND DEVICE FOR TESTING EPROM TYPE SEMICONDUCTOR DEVICE DURING BURN-IN
摘要
申请公布号	JPS6352073(A)	申请公布日期	1988.03.05
申请号	JP19870182109	申请日期	1987.07.21
申请人	SGS MICROELETTRONICA SPA	发明人	RUCHIO KOTSUJI
分类号	H01L27/10;G01R31/26;G01R31/28;G01R31/30;G11C29/00;G11C29/06;G11C29/50;H01L21/66;H01L21/8247;H01L29/788;H01L29/792	主分类号	H01L27/10
代理机构		代理人
主权项
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