发明名称 X-RAY DIFFRACTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To facilitate setting a large sample horizontally when a vertical goniometer is used. SOLUTION: Three adjusting members 8 comprising screws 9, springs 10 and motors 11 are arranged on a sample support plate 12, and a sample 6 is engaged with the adjusting members 8. Three distance sensors 7 for measuring the distance up to the sample surface are disposed over the sample 6. The sample surface is adjusted horizontally by driving the adjusting members so that the outputs of the distance sensors become the same prescribed value, and height adjustment is executed so that the rotation center of the goniometer agrees with the sample surface. After setting the sample, a diffracted X-ray obtained by diffracting an X-ray from an X-ray tube 1 by the sample 6 is detected to execute X-ray diffraction analysis, by moving synchronously and rotatavely the X-ray tube 1 and a detector 3 around the rotation center 5.</p>
申请公布号 JP2001311705(A) 申请公布日期 2001.11.09
申请号 JP20000130085 申请日期 2000.04.28
申请人 SHIMADZU CORP 发明人 MATSUO MASAYUKI
分类号 G01N23/207;(IPC1-7):G01N23/207 主分类号 G01N23/207
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