发明名称 SEMICONDUCTOR STORAGE DEVICE AND REDUNDANT MEMORY REPAIR METHOD
摘要 <p>PURPOSE:To attain a high speed and also a large storage capacity by disposing peripheral circuits in cross areas formed of a longitudinal central part and a lateral central part and by disposing memory arrays in four regions divided by the cross areas. CONSTITUTION:In a semiconductor chip or in each of areas divided by the longitudinal center line thereof, peripheral circuits are disposed in cross areas A to E formed of the longitudinal central part and the lateral central part thereof, while memory arrays M are disposed in four regions divided by the cross areas A to E. As the peripheral circuits are disposed in the central parts of the chip or in each of the areas according to this constitution, the maximum transmission path of signals can be shortened to the half of a chip size substantially, and therefore DRAM designed to have a large storage capacity can be made to operate at a high speed.</p>
申请公布号 JPH03214669(A) 申请公布日期 1991.09.19
申请号 JP19890065840 申请日期 1989.03.20
申请人 HITACHI LTD;HITACHI VLSI ENG CORP 发明人 KAJITANI KAZUHIKO;YAMAGUCHI YASUNORI;OSHIMA KAZUYOSHI;YAMAZAKI TAKASHI;MIYAMOTO EIJI;SAKAI YUJI;SAWADA JIRO;ETO JUN;HORIGUCHI SHINJI;IKENAGA SHINICHI;KUMADA ATSUSHI;TSUNOSAKI MANABU;KASAMA YASUHIRO;UDO SHINJI;YOSHIOKA HIROSHI;SAITO HIROMI;TAKANO MITSUHIRO;MORINO MAKOTO;MIYATAKE SHINICHI;MATSUMOTO TETSUO
分类号 G11C11/41;G11C11/401;G11C11/407;G11C11/409;G11C29/00;G11C29/04;H01L21/82;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 G11C11/41
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