发明名称 SEMICONDUCTOR DEVICE AND METHODS OF FABRICATING THE SAME
摘要 A semiconductor device and a method for manufacturing the same are provided to acquire enhanced electrical properties from an MOSFET structure by obtaining optimum work functions from gate electrodes of NMOSFET and PMOSFET and preventing a depletion region from being at a polycrystalline silicon electrode using a metallic residue and a polycrystalline silicon layer on the metallic residue. A gate insulating layer is formed on a semiconductor substrate(S10). A metal film is formed on the gate insulating layer(S20). The metal film is selectively etched to leave a metallic residue at an interface between the metal film and the gate insulating layer(S40). A polycrystalline silicon layer is formed on the gate insulating layer including the metallic residue(S50).
申请公布号 KR100729367(B1) 申请公布日期 2007.06.11
申请号 KR20060049470 申请日期 2006.06.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, TAEK SOO;JEON, IN SANG;KANG, SANG BOM;PARK, HONG BAE;CHO, HAG JU;LEE, HYE LAN
分类号 H01L21/336 主分类号 H01L21/336
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