发明名称 SEMICONDUCTOR MEMORY DEVICE AND MEHTOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
摘要 <p>A semiconductor memory device and a method for manufacturing the same are provided to memorize data according to the amount of holes accumulated in a body region. A first and second semiconductor layers face each other. A back gate insulating layer is formed between the first and second semiconductor layers. A first conductive type plate is formed in the first semiconductor layer. A gate insulating layer is formed on a surface of the semiconductor layer. A gate electrode comes in contact with the gate insulating layer. A first conductive type body region is formed at an opposing region between the gate electrode and the gate insulating layer in the second semiconductor layer. A second conductive type source and drain layers are formed at both sides of the body region within the second semiconductor layer. A second conductive type diffusion layer(11) is formed on in a surface region of the first semiconductor layer. The body region is in an electrically floating state and memorizes data by accumulating or discharging electric charges.</p>
申请公布号 KR20080067976(A) 申请公布日期 2008.07.22
申请号 KR20080004801 申请日期 2008.01.16
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHINO TOMOAKI
分类号 H01L27/115 主分类号 H01L27/115
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