首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
HIGH IMPEDANCE MEASURING APPARATUS
摘要
申请公布号
US3434050(A)
申请公布日期
1969.03.18
申请号
USD3434050
申请日期
1966.04.25
申请人
NASA USA
发明人
MICHAEL M.E. VAN SCHOIACK
分类号
G01R27/02;(IPC1-7):G01R27/08;G05F1/40;G05F1/60
主分类号
G01R27/02
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Perfectionnements aux compresseurs
Résine alkyde modifiée à l'huile
Improvements in and relating to fasteners
Attache pour agrafeuse
Improvements in back-rests for bedsteads
Improvements relating to the prevention of after-running of internal combustion engines
Improvements in or relating to a method of making sporting cartridge cases having a synthetic body or bottom and cartridges obtained thereby
Improvements in or relating to electric arc converters
ΜΕΘΟΔΙΚΟΣ ΤΡΟΠΟΣ ΜΗΧΑΝΟΛΟΓΙΚΗΣ ΣΧΕΔΙΑΣΕΩΣ ΔΙΑ ΣΕΙΡΑΣ ΕΙΔΙΚΩΝ ΤΕΤΡΑΔΙΩΝ.
Improvements in or relating to control apparatus for heating and cooling systems
Furnace charge support and diffuser
Perfectionnement apporté au curseur des fermetures à curseur
Process for the plasticising of halogen-containing organic materials
Improvements in the production of n-monosubstituted monoureines of glyoxal
Trihalo-1-d-ribofuranosyl-benzimidazole compounds
Diammonio esters containing two heterocyclic groups
Substituted alanines
An improved instantaneous-grip vice
Improvements in machines for producing cigarettes or the like
Improvements relating to combined pressure and vacuum relief valves
