| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method for inspecting fine defects by imaging transmitted light through a light-transmitting body, such as a glass tube, an image processing algorithm of the picked-up image, and to provide a device using them. SOLUTION: A slit light 5L is used as illumination light, and the slit light 5L is set so as to be in parallel with the rotation axis of an inspection object 1 or to intersect with the rotation axis in the horizontal direction.
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