发明名称 MULTILEVEL CONFIGURABLE LOGIC ANALYZER
摘要 A logic analyzer is provided with probes (20) deriving the signals to be tested which are introduced into a digitizer (22) provided with comparators which carry out a digitization according to a logic system having two states. It comprises a change-over circuit (21) arranged between the probe and the digitizer, which permits associating several or all comparators with a given signal to be tested to extend its digitization to a multi-level logic system. The change-over circuit (21) is constituted by a matrix of MOS transfer gates or field effect transistors (FET's). When the multi-level logic system has at least one medium state limited by two references, the medium state is displayed on a display device (24) according to a straight line or a monotonic curve joining the two references between the beginning and the end of the medium state. When the duration of the medium state exceeds a predetermined duration, the display device (24) is switched on to display the medium state.
申请公布号 US5177483(A) 申请公布日期 1993.01.05
申请号 US19890367528 申请日期 1989.06.16
申请人 U.S. PHILIPS CORPORATION 发明人 BOUTIGNY, PIERRE-HENRI;NGUYEN, HUY A.;RAOULX, DENIS
分类号 G01R13/28;G01R19/165;G01R31/317;G01R31/3177;G06F11/25 主分类号 G01R13/28
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