发明名称 |
ALIGNMENT KEY FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: An alignment key for fabricating a semiconductor device is provided to precisely analyze the center position of a trench by forming the first alignment key composed of a plurality of trench-type fine patterns so that a thin film like a tungsten layer is uniformly formed in the trench of the first alignment key by a predetermined thickness. CONSTITUTION: The alignment key for fabricating the semiconductor device is composed of a plurality of the trench-type fine patterns that are separated from one another. The alignment key is of a bar type, disposed as a quadrangular shape. A thin film is formed on the alignment key and a photoresist pattern of a box type is formed inside the alignment key disposed as a quadrangular shape.
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申请公布号 |
KR20030036955(A) |
申请公布日期 |
2003.05.12 |
申请号 |
KR20010067905 |
申请日期 |
2001.11.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, DEUK SU |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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