发明名称 ALIGNMENT KEY FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: An alignment key for fabricating a semiconductor device is provided to precisely analyze the center position of a trench by forming the first alignment key composed of a plurality of trench-type fine patterns so that a thin film like a tungsten layer is uniformly formed in the trench of the first alignment key by a predetermined thickness. CONSTITUTION: The alignment key for fabricating the semiconductor device is composed of a plurality of the trench-type fine patterns that are separated from one another. The alignment key is of a bar type, disposed as a quadrangular shape. A thin film is formed on the alignment key and a photoresist pattern of a box type is formed inside the alignment key disposed as a quadrangular shape.
申请公布号 KR20030036955(A) 申请公布日期 2003.05.12
申请号 KR20010067905 申请日期 2001.11.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, DEUK SU
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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