发明名称 FUNCTION INSPECTING METHOD FOR MEMORY CARD SYSTEM
摘要 PURPOSE:To easily inspect the reading writing function and the reliability of preserved data of the memory card system. CONSTITUTION:After data for inspection are written in the whole area of a memory card 8, the data are read, and a reading writing function is inspected. After the preserved data are written at the area for preserving the data of the memory card 8, the sum is obtained, and the value to subtract the above- mentioned sum from suitable reference data is written to the backup address of the memory card 8. When the preserved data are read out of the memory card 8, the sum of the data of the whole storing area is obtained, and according to the fact that the value is matched with the reference data, the reliability of the preserved data is inspected.
申请公布号 JPH04276397(A) 申请公布日期 1992.10.01
申请号 JP19910061193 申请日期 1991.03.01
申请人 SHIMADZU CORP 发明人 HAYASHI HIDENORI
分类号 G01R31/28;G06F12/16;G06K17/00;G11C7/00;G11C29/00;G11C29/02;G11C29/56 主分类号 G01R31/28
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