| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test pattern measuring method and an image forming device which accurately perform the density sensing of a test pattern in such a manner that in order to perform the accurate density sensing of the test pattern, a reflected light quantity at a pattern forming position of an endless-shape turning body being an underlayer needs to be accurately sensed by accurately sensing a mutual relationship between the underlayer position on the endless-shape turning body, and the test pattern position. <P>SOLUTION: A test pattern A is formed on the endless-shape turning body which turns in one direction (S401). The test pattern A is sensed by a sensor which senses the reflected light by irradiating light on the endless-shape turning body (S402). Regarding the underlayer section after the test pattern A on the endless-shape turning body, the reflected light quantities at a plurality of locations are measured to obtain underlayer sampling values (S403). A test pattern B is formed after the test pattern A (S404), and the test pattern A which has gone around is sensed (S405). A value which corresponds to the test pattern B is selected from the underlayer sampling values from the sensed result (S406). The reflected light quantity of the test pattern B is measured (S407), and the measured value is corrected from the selected underlayer sampling value. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
