发明名称 NONVOLATILE MEMORY DEVICE AND OPERATION METHOD OF DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a flash memory device that is decreased in chip area, and has bit line bias and bit line coupling formed in an array area by using low-voltage transistors, and an operation method of the device. <P>SOLUTION: The nonvolatile memory device includes wells in a first conduction type formed in a substrate, and a plurality of first memory cell transistors connected in series to bit lines formed in the wells. Buffers are formed outside the wells on the substrate, and connected to the bit lines. At least one decoupling transistor, which is formed so as to separate the buffers from the bit lines, is formed in the well. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007221136(A) 申请公布日期 2007.08.30
申请号 JP20070032372 申请日期 2007.02.13
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIN DAIYO;HWANG SANG-WON;PARK JUN YONG
分类号 H01L21/8247;G11C16/06;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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