| 摘要 |
PURPOSE: An apparatus for testing devices in a board is provided to enable defected devices mounted on a board to be verified by carrying out the verification of the defected devices with association to a control unit. CONSTITUTION: A test field programmable gate array(FPGA)(400) verifies defected devices based on a sequence output generated from each FPGA(200) receiving a control command to test devices from a main control unit, a sequence signal obtained from a clock pulse of an oscilloscope(100), and an output of JTAG-supporting device obtained by generating a JTAG command to the JTAG-spporting device(300). An LED display part(500) displays defected devices through a result tested by the test FPGA(400), to thereby stabilize an equipment more rapidly. |
