发明名称 |
Solid state image pickup apparatus having test signal generator |
摘要 |
PCT No. PCT/JP93/00007 Sec. 371 Date Aug. 2, 1993 Sec. 102(e) Date Aug. 2, 1993 PCT Filed Jan. 7, 1993 PCT Pub. No. WO93/14602 PCT Pub. Date Jul. 22, 1993.A solid state image pickup apparatus includes a solid state image pickup device for receiving an optical image of an object and generating an electrical image signal representing the optical image of the object in synchronism with a driving pulse from a driving circuit. A sampling circuit generates a sampled image signal by sampling the electrical image signal read out of the solid state image pickup device with a first sampling pulse from a first pulse circuit synchronized with the driving pulse. An analog-to-digital convertor converts the sampled image signal to a digital image signal with a second sampling pulse from a second pulse circuit. A test signal generator generates a test signal which is synchronized with the driving pulse and alternately changes in level between consecutive pixels. A controller controls the phase of the first sampling pulse and the phase of the second sampling pulse relative to each other by processing the test signal.
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申请公布号 |
US5406329(A) |
申请公布日期 |
1995.04.11 |
申请号 |
US19930098273 |
申请日期 |
1993.08.02 |
申请人 |
IKEGAMI TSUSHINKI CO., LTD. |
发明人 |
KASHIMURA, NAOKI;KAWAMURA, KAZUHIRO |
分类号 |
H03M1/12;H04N5/217;H04N5/335;H04N5/365;H04N5/378;H04N9/093;H04N17/00;(IPC1-7):H04N17/00 |
主分类号 |
H03M1/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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