Thermal switch with self-test feature

摘要

A normally open thermal switch ( 200 ) having a bimetallic disk ( 18 ) is configured for operational testing in its installed position when exposed to a changing temperature by a test box ( 400 ) having a power source ( 400 a). The in-place testing advantageously confirms triggering action of the switch by an event indicator ( 400 c) at the operational temperatures designed into the switch ( 200 ). The temperature of the triggering action is presented on a temperature display ( 400 b) and recorded by a data recorder ( 400 d) of the test box ( 400 ). The switch ( 200 ) incorporates a heating element ( 24 c) to heat changing the bimetallic disk ( 18 ) to snap activate at the operative temperatures. The thermal switch ( 200 ) is coupled with the test box ( 400 ) to confirm its operation without having to remove the switch from its installed location.