| 摘要 |
<p>PROBLEM TO BE SOLVED: To properly execute a test of a memory part, in the actually using state of a semiconductor integrated circuit. SOLUTION: In this device for executing the test of the memory part 1, in the semiconductor integrated circuit equipped with the memory part 1 and a logic part 2 operated by receiving an operation signal, for supplying the memory part 1 with a data signal from a data output part 5, and receiving the data signal from the memory part 1 into a data input part 4, a test signal is applied to the memory part 1 separately from the logic part 2; and the operation signal is supplied to the logic part 2 to cause the logic part 2 to be operated.</p> |
