发明名称 Semiconductor device and wiring tape for semiconductor device
摘要 <p>A semiconductor device has a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 provided on both sides of the core layer 1 as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen thermal stress generated between the semiconductor device and the package substrate. The thickness ratio of core layer 1 to total buffer layer is at least 0.2. The production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability. <IMAGE></p>
申请公布号 EP0883180(A2) 申请公布日期 1998.12.09
申请号 EP19980110007 申请日期 1998.06.02
申请人 HITACHI, LTD.;HITACHI CABLE, LTD. 发明人 OGINO, MASAHIKO;EGUCHI, SHUJI;NAGAI, AKIRA;UENO, TAKUMI;SEGAWA, MASANORI;KOKAKU, HIROYOSHI;ISHII, TOSHIAKI;ANJO, ICHIRO;NISHIMURA, ASAO;MIYAZAKI, CHUICHI;MITA, MAMORU;OKABE, NORIO
分类号 H01L23/12;H01L23/495;H01L21/48;H01L21/58;H01L21/60;H01L23/31;H01L23/498;(IPC1-7):H01L23/495 主分类号 H01L23/12
代理机构 代理人
主权项
地址