Semiconductor device and wiring tape for semiconductor device
摘要
<p>A semiconductor device has a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 provided on both sides of the core layer 1 as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen thermal stress generated between the semiconductor device and the package substrate. The thickness ratio of core layer 1 to total buffer layer is at least 0.2. The production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability. <IMAGE></p>