发明名称 SEMICONDUCTOR DEVICE AND TESTING METHOD THEREOF
摘要 A semiconductor device includes a sense amplifier, a drive circuit that operatively supplies a predetermined potential to the sense amplifier, and disconnection transistors that are provided between the sense amplifier and the drive circuit. According to the present invention, the disconnection transistors can disconnect the sense amplifier from the drive circuit. Therefore, when the sense amplifier is disconnected from the drive circuit during at least a part of a period from when the word line is activated till when the sense amplifier is activated, outflow and inflow of charge from and into the bit line can be stopped immediately.
申请公布号 US2009154275(A1) 申请公布日期 2009.06.18
申请号 US20090369201 申请日期 2009.02.11
申请人 ELPIDA MEMORY, INC. 发明人 MATSUMOTO YASUHIRO
分类号 G11C7/06 主分类号 G11C7/06
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