| 摘要 |
PROBLEM TO BE SOLVED: To obtain an X-ray diffraction apparatus capable of performing X-ray diffraction and measurement with respect to both of a sample large in crystal grain and a sample small in crystal grain under a proper condition. SOLUTION: An X-ray element support apparatus 11 can support a Solar slit 12 forming a parallel X-ray beam and a collimator forming a fine caliber X-ray beam in a replaceable manner. An X-ray detector 21 can selectively realize a position resolving function measuring the intensity of X-rays taken in linearly by CCD detector 9 at every position of the linear range of X-rays and an intensity averaging function averaging the intensities of linearly taken-in Xrays in the whole or a part of the linear range of X-rays to measure them as one intensity of X-rays. By selecting the solar slit 12 and the collimator and selecting the function of the X-ray detector 21, X-ray diffraction and measurement can be performed under a proper condition regardless of the size of a crystal grain.
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