发明名称 METHOD FOR DRYING WAFER BY USING DIFFERENCE OF SURFACE TENSION
摘要 PURPOSE: A method for drying a wafer by using a difference of surface tension is provided to have no influence on the environment and to prevent a fire, by effectively drying a wafer and by eliminating the need to use organic solvent except deionized water in drying the wafer. CONSTITUTION: The wafer(1) soaked in deionized water consecutively supplied to a process tank at a uniform flow rate, is elevated to the surface of the wafer. Heat is transferred from a heat source(5) installed outside the process tank to the surface of the elevated wafer to make the surface of the wafer maintain a temperature higher than the temperature of the deionized water. The deionized water on the surface of the wafer is eliminated by the difference of surface tension before the wafer is elevated over the surface of the deionized water.
申请公布号 KR20020039450(A) 申请公布日期 2002.05.27
申请号 KR20000069273 申请日期 2000.11.21
申请人 HONG, SANG HEE 发明人 HONG, SANG HEE
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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