发明名称 METHOD FOR INSPECTING SURFACE
摘要 According to a technical idea of the present invention, a method to inspect a surface comprises: a step of irradiating a test object by changing incident light of a first polarization state into parallel light having a cross section; and a step of measuring the second polarization state of light reflected from the test object. Inspection on the entire area to which the incident light is emitted in an inspection object is able to be carried out using a variation between the first polarization state and the second polarization state. As such, the speed of inspection is able to be improved.
申请公布号 KR20160066448(A) 申请公布日期 2016.06.10
申请号 KR20140170833 申请日期 2014.12.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KO, KANG WOONG;RYU, SUNG YOON;SOHN, YOUNG HOON;SONG, GIL WOO;AHN, TAE HEUNG;JEON, HYOUNG JO;HAN, SANG KYEONG;HORIE MASAHIRO;KO, WOO SEOK;YANG, YU SIN;LEE, SANG KIL;JEON, BYEONG HWAN
分类号 G01N21/956;H01L21/66 主分类号 G01N21/956
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