发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
Disclosed is a semiconductor device having a sealed structure which enables to highly accurately detect a defect occurred in a protective film. Also disclosed is a method for manufacturing such a semiconductor device. A semiconductor device (1) comprises a substrate (10), a semiconductor element (14) formed on the substrate (10), and a protective film (17) sealing the semiconductor element (14). The semiconductor device further has a first conductive layer (16) which is in contact with the back surface of the protective film (17) and a second conductive layer (18) which is in contact with the front surface of the protective film (17). |
申请公布号 |
WO2005071746(A1) |
申请公布日期 |
2005.08.04 |
申请号 |
WO2005JP00934 |
申请日期 |
2005.01.19 |
申请人 |
PIONEER CORPORATION;NAGAYAMA, KENICHI |
发明人 |
NAGAYAMA, KENICHI |
分类号 |
H01L23/29;H01L23/544;H01L23/58 |
主分类号 |
H01L23/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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