发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 Disclosed is a semiconductor device having a sealed structure which enables to highly accurately detect a defect occurred in a protective film. Also disclosed is a method for manufacturing such a semiconductor device. A semiconductor device (1) comprises a substrate (10), a semiconductor element (14) formed on the substrate (10), and a protective film (17) sealing the semiconductor element (14). The semiconductor device further has a first conductive layer (16) which is in contact with the back surface of the protective film (17) and a second conductive layer (18) which is in contact with the front surface of the protective film (17).
申请公布号 WO2005071746(A1) 申请公布日期 2005.08.04
申请号 WO2005JP00934 申请日期 2005.01.19
申请人 PIONEER CORPORATION;NAGAYAMA, KENICHI 发明人 NAGAYAMA, KENICHI
分类号 H01L23/29;H01L23/544;H01L23/58 主分类号 H01L23/29
代理机构 代理人
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