发明名称 LSI INSPECTION CIRCUIT, METHOD FOR DESIGNING THE SAME AND METHOD FOR FORMING TEST PROCEDURE THEREOF
摘要 PROBLEM TO BE SOLVED: To restrict an increase of a circuit area by inputting/outputting scan data with the utilization of an existing general purpose bus (shared conductor; data bus) in a data processing system including a scan circuit. SOLUTION: In the data processing system having the data bus 40 as the shared conductor, a scan chain 60 is constituted starting from a flip flop 39 connected to the data bus. Since inputting/outputting stored data in the scan chain is carried out via the data bus, the scan circuit is realized without requiring a special input/output (scan-in, scan-out) for the scan test, and the circuit area increase associated with designing the scan circuit is restricted. Moreover, flip flop 39, 48, 50 and 53 not connected to combinational circuits realize the san circuit without being replaced by scan flip flops, so that the circuit area increase associated with designing the scan circuit is restricted.
申请公布号 JP2002156420(A) 申请公布日期 2002.05.31
申请号 JP20000354107 申请日期 2000.11.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MORIKAWA MASANOBU;SUGIMURA YUKIO
分类号 G01R31/28;G06F11/22;G06F17/50;H01L21/82;H01L21/822;H01L27/04 主分类号 G01R31/28
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