| 摘要 |
A mother substrate for an OLED and an inspection method thereof are provided to accurately measure a leakage current by supplying a predetermined voltage to a non-inspection pixel or a non-inspection OLED using an independent voltage source. A mother substrate for an OLED(Organic Light Emitting Diode) includes a pixel unit(310), an inspection voltage source(340), a power source(350), and first and second switching units(320,330). The pixel unit includes plural pixels having OLEDs. The inspection voltage source supplies first and second voltages to the pixel unit and measures a current flowing through the pixel unit. The power source supplies a third voltage to the pixel unit. The first switching unit supplies the first voltage, received from the inspection voltage source, to a predetermined pixel in the pixel unit. The second switch unit supplies the second voltage, which is received from the inspection voltage source, to a predetermined pixel in the pixel unit. The second switch supplies the third voltage, which is received from the power source, to the rest pixels except for the predetermined pixel.
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