AUTO PROBE INSPECTION APPARATUS AND INSPECTION METHOD OF PANEL USING THE SAME

摘要

The present invention proposes an auto probe inspection apparatus. According to an embodiment of the present invention, the auto probe inspection apparatus comprises: a panel fixing unit which fixes a panel to a lower surface; a work table which is disposed below the panel fixing unit and moves the panel to the panel fixing unit; a first driving unit which moves the work table upward and downward; a plurality of probe units which are disposed below the panel fixing unit and contact a pad portion of the panel fixed to the panel fixing unit to perform a test on the panel; and a housing which is mounted with the probe units and accommodates the first driving unit; and a second driving unit which upwardly moves the housing such that the probe units contact or are detached from the pad portion of the panel, wherein the probe units are upwardly moved by the second driving unit to contact the pad portion of the panel.