| 摘要 |
PROBLEM TO BE SOLVED: To provide a transfer apparatus, an IC inspection apparatus, a transfer method and an IC inspection method wherein a replacement work of replacing a plurality of holding parts for holding members to meet a change of transfer destinations of the members is facilitated and workers' errors can be reduced by forming the holding parts into a unit, and a total replacement time can be shortened by preliminarily preparing a unit to which holding parts corresponding to members to be transferred next are set. SOLUTION: The transfer apparatus has the plurality of holding parts 14, and transfers ICs held by each of the holding parts 14 to a predetermined position (onto an inspection socket). The plurality of holding parts 14 are formed into a change kit unit 11.
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