Method for testing integrated circuit, involves receiving and evaluating switching characteristic of integrated circuit, particularly switch-on characteristic

摘要

The method involves modifying a pre-determined component internal voltage generator network, in such a manner that the response of a pre-determined component-internal voltage generator of the voltage generator network is affected. The switching characteristic of the integrated circuit, particularly the switch-on characteristic of the integrated circuit is received and evaluated. Independent claims are also included for the following: (1) a system for testing an integrated circuit (2) an integrated circuit.