发明名称 MANUFACTURE OF MEMORY DEVICE
摘要 forming a first material layer on a substrate having a transistor and a bit line; forming a first pattern defined lay cells and consisting of a second material layer; forming a contact hole for electrical connecting between the source region and the storage electrode by removing the material layer positioned on the source region; forming a second conduction layer over the resulting structure; forming a spacer of the second conduction layer on the side wall of the first pattern and on the inner wall of the contact hole by anisotropic etching; and removing the first pattern. The method increases capacitance within a limited unit cell.
申请公布号 KR960005251(B1) 申请公布日期 1996.04.23
申请号 KR19920019990 申请日期 1992.10.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN, JOO - YOUNG
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/04
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