发明名称 |
MANUFACTURE OF MEMORY DEVICE |
摘要 |
forming a first material layer on a substrate having a transistor and a bit line; forming a first pattern defined lay cells and consisting of a second material layer; forming a contact hole for electrical connecting between the source region and the storage electrode by removing the material layer positioned on the source region; forming a second conduction layer over the resulting structure; forming a spacer of the second conduction layer on the side wall of the first pattern and on the inner wall of the contact hole by anisotropic etching; and removing the first pattern. The method increases capacitance within a limited unit cell.
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申请公布号 |
KR960005251(B1) |
申请公布日期 |
1996.04.23 |
申请号 |
KR19920019990 |
申请日期 |
1992.10.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YUN, JOO - YOUNG |
分类号 |
H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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