发明名称 CIRCUIT BOARD INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To improve the detection ratio to various kinds of circuit parts by sorting each resistance value between mutual circuit patterns formed on an acceptable circuit board into two groups of high and low resistance values to two kinds of threshold values, and registering the same, and thereafter determinating whether the resistance value of board of same kind to be inspected belongs to each group formerly classified. SOLUTION: A data take-in step is carried out by a CPU 11. An acceptable circuit board 2 is set on pin probes 3, 3..., and under the state in which the probes 3, 3... are brought into contact with a circuit pattern P, the CPU outputs a control signal S13, operates the resistance value between both circuit patterns P, P being in contact with the paired probes 3, 3, and classifying the same into low or high resistance group to two kinds of threshold values, then it is stored in a memory 12. In a circuit pattern inspection step, a board 2 to be inspected which is the same kind as the acceptable circuit board 2 is set on the probes 3, 3..., then the CPU 11 measures the resistance value between the circuit patterns P, P, and determines whether it belongs to one of the two groups classified by the data take-in step.
申请公布号 JPH10142281(A) 申请公布日期 1998.05.29
申请号 JP19960312997 申请日期 1996.11.08
申请人 HIOKI EE CORP 发明人 KANAI TOSHIHIKO;SHIMODAIRA HOMARE
分类号 G01R31/02;G01R27/02;H05K13/08 主分类号 G01R31/02
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