| 摘要 |
PURPOSE: To easily and speedily detect failure of flipflops, and reduce a delivery period of a semiconductor integrated circuit device. CONSTITUTION: A generation circuit 1 generates plural test data TD1, TD2 to be supplied to plural flipflops 3a, 3b. A supply circuit 2 supplies the generated test data TD1, TD2 to the flipflops 3a, 3b which correspond to the test data TD1, TD2. A determination circuit 4 determines failure of the flipflops 3a, 3b based on the test data TD1, TD2 supplied to the flipflops 3a, 3b, and output data D01, D02 outputted from the flipflops 3a, 3b in accordance with the test data TD1, TD2. |
