发明名称 Solution testing equipment
摘要 There is provided solution testing equipment which can detect an output variation of a THz oscillation device using a THz wave (hν) by contacting a liquid or cells on an RTD oscillation device, and can reduce the size and weight thereof. The solution testing equipment includes: a THz oscillation device configured to radiate the THz wave Is; a THz detection device configured to receive the THz wave Is; and a solution as a test object disposed on the THz oscillation device, in which the solution is tested on the basis of output characteristics of the terahertz wave varying in response to a relative permittivity of the solution.
申请公布号 US9431960(B2) 申请公布日期 2016.08.30
申请号 US201314084658 申请日期 2013.11.20
申请人 ROHM CO., LTD.;KYOTO UNIVERSITY 发明人 Mukai Toshikazu;Ogawa Yuichi
分类号 G01R27/04;H03B7/14;G01N22/00 主分类号 G01R27/04
代理机构 Rabin & Berdo, P.C. 代理人 Rabin & Berdo, P.C.
主权项 1. A solution testing equipment, comprising: a terahertz (THz) oscillation device configured to radiate a THz wave; a THz detection device configured to receive the THz wave; an insulating film disposed so as to cover the THz oscillation device, the insulating film being in contact with the THz oscillation device; a solution as a test object disposed on the THz oscillation device, the solution being in contact with the insulating film; and a glass plate disposed at an upper side of the insulating film, wherein the solution is disposed on the THz oscillation device by interposing the glass plate therebetween, and the solution is tested on the basis of output characteristics of the THz wave varying in response to a relative permittivity of the solution.
地址 Kyoto JP