| 摘要 |
There is disclosed a device for applying vibrations to a cantilever used in an atomic force microscope. The cantilever has a base portion, and a probe is attached to the front end of the cantilever. The device has a piezoelectric plate subassembly consisting of first and second piezoelectric plates having junction faces cemented together. A piezoelectric plate subassembly support portion supports a part of the second piezoelectric plate. A voltage is applied to the piezoelectric plates so that one of them is stretched vertical to the junction faces and that the other is contracted vertical to the junction faces.
|
