| 摘要 |
<p>A method of manufacturing an optical transmission module and a bit error rate (BER) characteristic inspection system and method. By inspecting with high precision in a short period of time the low BER characteristic of an optical transmission module used in a light communication system (optical transmission system) that is being demanded as the speed and capacity of the information communication system is increasing. This inspection system can calculate easily the theoretical amount of degradation of the signal-to-noise (S/N) ratio by using rectangular wave pulses as interference light. Hence, from the bit error rate of a light signal thus measured, the factor in the case of no interference light (S/X= or X=0) is extrapolated by using a bit error rate theoretical value, to inspect the BER characteristic of the optical transmission module used in an optical transmission system.</p> |
