发明名称 Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices
摘要 A system and method for providing a memory cell on a semiconductor is disclosed. In one aspect, the method and system include providing at least one gate stack on the semiconductor, depositing at least one spacer, and providing at least one source implant in the semiconductor. The at least one gate stack has an edge. A portion of the at least one spacer is disposed along the edge of the at least one gate stack. In another aspect, the method and system include providing at least one gate stack on the semiconductor, providing a first junction implant in the semiconductor, depositing at least one spacer, and providing a second junction implant in the semiconductor after the at least one spacer is deposited. The at least one gate stack has an edge. A portion of the at least one spacer is disposed at the edge of the at least one gate stack. In a third aspect, the method and system include providing at least one gate stack on the semiconductor, providing at least one source implant in the semiconductor, depositing at least one spacer after the at least one source implant is provided, and providing at least one drain implant in the semiconductor after the spacer is deposited. The at least one gate has an edge. A portion of the at least one spacer is disposed along the edge of the at least one gate.
申请公布号 US6025240(A) 申请公布日期 2000.02.15
申请号 US19970993600 申请日期 1997.12.18
申请人 ADVANCED MICRO DEVICES, INC. 发明人 CHAN, VEI-HAN;LUNING, SCOTT D.;RANDOLPH, MARK;TRIPSAS, NICHOLAS H.;SOBEK, DANIEL;WANG, JANET;THURGATE, TIMOTHY J.;HADDAD, SAMEER
分类号 H01L21/336;(IPC1-7):H01L21/824 主分类号 H01L21/336
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