发明名称 |
Multi-axis type three-dimensional measuring apparatus |
摘要 |
A multi-axis type three-dimensional measuring apparatus includes a multi-axis arm mechanism, a probe formed in a distal end of the multi-axis arm mechanism and configured to measure a workpiece, and a projector formed in the distal end of the multi-axis arm mechanism and configured to scale a range of a projected projection image according to a distance between the workpiece and the probe. The projector is configured to project full-scale projection graphics of said workpiece so as to match the full-scale projection graphics with the workpiece regardless of a difference in a distance between the workpiece and the probe, and to project display information identifying a measurement schedule position by the probe. |
申请公布号 |
US9395169(B2) |
申请公布日期 |
2016.07.19 |
申请号 |
US201414563205 |
申请日期 |
2014.12.08 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
Abe Shinsaku |
分类号 |
G01B5/008;G01B21/04 |
主分类号 |
G01B5/008 |
代理机构 |
Oliff PLC |
代理人 |
Oliff PLC |
主权项 |
1. A multi-axis type three-dimensional measuring apparatus comprising:
a multi-axis arm mechanism; a probe formed in a distal end of the multi-axis arm mechanism and configured to measure a workpiece; and a projector formed in the distal end of the multi-axis arm mechanism and configured to scale a range of a projected projection image according to a distance between the workpiece and the probe, wherein the projector is configured to project full-scale projection graphics of said workpiece so as to match the full-scale projection graphics with the workpiece regardless of a difference in a distance between the workpiece and the probe, and to project display information identifying a measurement schedule position by the probe. |
地址 |
Kawasaki JP |