发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor structure includes a semiconductor substrate, a first active region, a second active region, a first trench, at least one protrusion part, and a first dielectric. The first active region exists in the semiconductor substrate. The second active region exists in the semiconductor substrate. The first trench exists in the semiconductor substrate, and separates the first active region from the second active region. The protrusion part protrudes from the semiconductor substrate and is arranged in the first trench. The first dielectric exists in the first trench and covers the protrusion part. So, a separation process can be carried out based on local oxidation of silicon (LOCOS).
申请公布号 KR20160081770(A) 申请公布日期 2016.07.08
申请号 KR20150118233 申请日期 2015.08.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 FANG CONG MIN;KUO KANG MIN;WU SHI MIN
分类号 H01L21/8238;H01L21/762;H01L27/118;H01L29/78 主分类号 H01L21/8238
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