发明名称 METHOD FOR TESTING ELECTRONIC COMPONENTS
摘要 <p>The invention features a device (1) comprising processing means (13) capable of controlling test equipment (2) to carry out repeatedly some at least of its steps, each time reducing the duration of at least one of them until satisfying a final criterion taking into account the distribution of the electric variables measured by the said equipment for each reduced duration value, and to set a new duration value at most equal to its initial value, for which the measured electric variable distribution satisfies one selected dispersion condition. It further comprises a function generator (14), capable of providing a function applicable to at least one of the terms of a comparison executed during one of the said steps, so that the said function operates on a measurement executed after the new duration.</p>
申请公布号 WO1997045748(A1) 申请公布日期 1997.12.04
申请号 FR1997000908 申请日期 1997.05.23
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