发明名称 EXPOSURE APPARATUS, EXPOSURE METHOD AND DEVICE MANUFACTURING METHOD
摘要 <p>A pattern image is generated by pattern image forming apparatuses (10, 12, PL), and at least a part of the generated pattern image or a part of a pattern image generated and formed on a substance is photoelectrically detected by detecting systems (42, 48). Then, a modifying apparatus (32) modifies design data to be inputted to the pattern image generating apparatuses based on the detection results. Therefore, corresponding to the input of the modified design data, the pattern image is generated on the substance (P) by the pattern image generating apparatuses and the substance is exposed with the pattern image. Thus, a desired pattern is accurately formed on the substance.</p>
申请公布号 KR20080068006(A) 申请公布日期 2008.07.22
申请号 KR20087006595 申请日期 2008.03.18
申请人 NIKON CORPORATION 发明人 INOUE HIDEYA;KIUCHI TOHRU
分类号 H01L21/027 主分类号 H01L21/027
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