| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To easily diagnose a failure of a semiconductor integrated circuit with a built-in self-test circuit for a memory. <P>SOLUTION: The semiconductor integrated circuit 50 is provided with a BIST circuit 1 and a memory collar 2. The memory collar 2 is provided with a memory output result analyzing circuit 3 and a memory cell 21. In BIST operation, when a defect is detected, the BIST operation is completed while the detected defect is stored in a fetching register 31 of the memory output result analyzing circuit 3. When a failure detection signal S109 outputted from a two-input OR circuit OR1 of the memory output result analyzing circuit 3 is inputted to a diagnostic data transferring/storing circuit 16 of the BIST circuit 1, the diagnostic data transferring/storing circuit 16 starts its operation. When a shift enable signal S108 is outputted from the diagnostic data transferring/storing circuit 16, the data stored in the fetching register 31 is automatically transferred to the diagnostic data transferring/storing circuit 16. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
