发明名称 Method and device for plasma-treating workpieces
摘要 The method and device are used to plasma-treat workpieces. The workpiece is inserted into a chamber of a treatment station that can be at least partially evacuated. The plasma chamber is bounded by a chamber bottom, a chamber cover, and a lateral chamber wall. The method process is optically monitored at least at times. In the optical monitoring, spectral lines of the radiation of the plasma above 500 nanometers are evaluated. Preferably, the evaluation is performed for frequencies above 700 nanometers.
申请公布号 US9371585(B2) 申请公布日期 2016.06.21
申请号 US201113634138 申请日期 2011.03.03
申请人 KHS CORPOPLAST GMBH 发明人 Siebels Sönke;Kytzia Sebastian
分类号 C23C16/00;C23C16/52;C23C16/04;C23C16/511;G01J3/02;G01J3/443;G01N21/68;H01J37/32 主分类号 C23C16/00
代理机构 Lucas & Mercanti, LLP 代理人 Lucas & Mercanti, LLP ;Stoffel Klaus P.
主权项 1. A method for plasma treatment of a workpiece, comprising the steps of: placing the workpiece into a plasma chamber; subsequently, under influence of a negative pressure, precipitating a coating onto the workpiece after ignition of a plasma; and at least temporarily optically monitoring a process sequence, including, during the optical monitoring, evaluating wave lengths of radiation of the plasma above 500 nanometers, transmitting at least a portion of emission radiation of the plasma through at least one light wave conductor to an optical monitor, and integrating the transmitted signal pattern determined by optical monitoring over at least a predeterminable period of time, wherein the wavelengths have wavelength range defined by transmission characteristics of the at least one light wave conductor, including integrating all intensities in a spectral range of 700 to 1000 nanometers.
地址 Hamburg DE