发明名称 |
POLISHING METHOD USING FIXED ABRASIVE PAD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing method using a fixed abrasive pad capable of polishing a wafer without using a polishing liquid in a polishing step or deteriorating a processing characteristic such as increase of micro scratch or deterioration in uniformity in a face. <P>SOLUTION: A suspension type wettable fixed abrasive pad 3 is made into a sufficiently wet condition with pure water or processing liquid mainly composed of pure water. After the pad surface is adjusted into such a wet condition as capable of suspending abrasive from the pad in a polishing process, polishing is conducted without supplying the polishing liquid during polishing. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2004358643(A) |
申请公布日期 |
2004.12.24 |
申请号 |
JP20030163392 |
申请日期 |
2003.06.09 |
申请人 |
ROKI TECHNO CO LTD |
发明人 |
TOMINAGA SHIGERU;SHIROTA WATARU |
分类号 |
B24B37/00;B24B37/20;B24B37/24;B24D3/00;B24D11/00;H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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