发明名称 POLISHING METHOD USING FIXED ABRASIVE PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing method using a fixed abrasive pad capable of polishing a wafer without using a polishing liquid in a polishing step or deteriorating a processing characteristic such as increase of micro scratch or deterioration in uniformity in a face. <P>SOLUTION: A suspension type wettable fixed abrasive pad 3 is made into a sufficiently wet condition with pure water or processing liquid mainly composed of pure water. After the pad surface is adjusted into such a wet condition as capable of suspending abrasive from the pad in a polishing process, polishing is conducted without supplying the polishing liquid during polishing. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004358643(A) 申请公布日期 2004.12.24
申请号 JP20030163392 申请日期 2003.06.09
申请人 ROKI TECHNO CO LTD 发明人 TOMINAGA SHIGERU;SHIROTA WATARU
分类号 B24B37/00;B24B37/20;B24B37/24;B24D3/00;B24D11/00;H01L21/304 主分类号 B24B37/00
代理机构 代理人
主权项
地址