发明名称 METHOD FOR FORMING INSPECTION ORDER OF PACKAGING PARTS AND METHOD FOR INSPECTING PACKAGING STATE
摘要 PROBLEM TO BE SOLVED: To shorten inspection time by reducing losses in an inspection cycle time. SOLUTION: Part packaging coordinate data are sorted into groups having a same level of warpages according to the warpage data of the substrates registered (step S201) in advance. Next, the distances between each point and the other points in the groups are calculated, and two points having the shortest distance therebetween are selected (step S203) and are joined to each other. This step is repeated, in the order of increasing distance, to form a chain (step S204). Then the distances from each chain to respective chains are determined (step S205), and each chain is joined (step S206) to a single chain in the order of increasing distance, to form a single chain.
申请公布号 JPH10341100(A) 申请公布日期 1998.12.22
申请号 JP19970148214 申请日期 1997.06.05
申请人 NEC CORP 发明人 MIYAUCHI KIYOSHI
分类号 H05K13/08;G06T1/00;G06T7/00 主分类号 H05K13/08
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