发明名称 METHOD OF PRODUCTION INFORMATION DATA ANALYSIS FOR SEMICONDUCTOR MANUFACTURING APPARATUS, AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To make data analysis to be used not only in a clean room by using a media in which the record of error information or production information is exchanged and carried easily, by storing the entire record of many error information and production information, extending memory areas for the error information and the production information, and improving the function of the media by the extension of a system parameter. SOLUTION: In the method of data analysis, error information that is generated, or the production information including a recipe or the like is directly recorded in an external storage media 12, while the error information and the production information are accessed to form the external storage media 12. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009004808(A) 申请公布日期 2009.01.08
申请号 JP20080235892 申请日期 2008.09.16
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HOSAKA EIJI;TAGASHIRA NAOKI;YOSHIDA HISASHI
分类号 H01L21/02;H01L21/66 主分类号 H01L21/02
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