发明名称 DEVICE AND METHOD FOR PROCESSING SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a device and a method for processing a semiconductor wafer avoiding wafer contamination and efficiently cooling a mounting pedestal of the semiconductor wafer after heating, thereby improving the throughput. SOLUTION: The device 1 for processing the semiconductor wafer includes: a chamber 3 for housing the semiconductor wafer W; and the wafer mounting pedestal 5 provided in the chamber 3 and having a mounting surface 7 for mounting the semiconductor wafer W. The device 1 for processing the semiconductor wafer processes the semiconductor wafer W in the chamber 3 by heating the mounting surface 7, while heating the semiconductor wafer W. The device 1 also includes a mounting-surface-cooling part 21 for cooling the mounting surface 7, and the mounting-surface-cooling part 21 has a cooling gas path 23 embedded in the wafer mounting pedestal 5 to get the gas for cooling through. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009049061(A) 申请公布日期 2009.03.05
申请号 JP20070211405 申请日期 2007.08.14
申请人 SUMITOMO ELECTRIC IND LTD 发明人 TANADA HARUYOSHI;HATTORI TETSUYA
分类号 H01L21/205;C23C16/46;H01L21/3065;H01L21/683 主分类号 H01L21/205
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