发明名称 |
DEVICE AND METHOD FOR PROCESSING SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a device and a method for processing a semiconductor wafer avoiding wafer contamination and efficiently cooling a mounting pedestal of the semiconductor wafer after heating, thereby improving the throughput. SOLUTION: The device 1 for processing the semiconductor wafer includes: a chamber 3 for housing the semiconductor wafer W; and the wafer mounting pedestal 5 provided in the chamber 3 and having a mounting surface 7 for mounting the semiconductor wafer W. The device 1 for processing the semiconductor wafer processes the semiconductor wafer W in the chamber 3 by heating the mounting surface 7, while heating the semiconductor wafer W. The device 1 also includes a mounting-surface-cooling part 21 for cooling the mounting surface 7, and the mounting-surface-cooling part 21 has a cooling gas path 23 embedded in the wafer mounting pedestal 5 to get the gas for cooling through. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009049061(A) |
申请公布日期 |
2009.03.05 |
申请号 |
JP20070211405 |
申请日期 |
2007.08.14 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
TANADA HARUYOSHI;HATTORI TETSUYA |
分类号 |
H01L21/205;C23C16/46;H01L21/3065;H01L21/683 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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