发明名称 Semiconductor device and method of embedding thermally conductive layer in interconnect structure for heat dissipation
摘要 A semiconductor device has a first thermally conductive layer formed over a first surface of a semiconductor die. A second surface of the semiconductor die is mounted to a sacrificial carrier. An encapsulant is deposited over the first thermally conductive layer and sacrificial carrier. The encapsulant is planarized to expose the first thermally conductive layer. A first insulating layer is formed over the second surface of the semiconductor die and a first surface of the encapsulant. A portion of the first insulating layer over the second surface of the semiconductor die is removed. A second thermally conductive layer is formed over the second surface of the semiconductor die within the removed portion of the first insulating layer. An electrically conductive layer is formed within the insulating layer around the second thermally conductive layer. A heat sink can be mounted over the first thermally conductive layer.
申请公布号 US9443828(B2) 申请公布日期 2016.09.13
申请号 US201514694811 申请日期 2015.04.23
申请人 STATS ChipPAC Pte. Ltd. 发明人 Pagaila Reza A.;Do Byung Tai;Chua Linda Pei Ee
分类号 H01L25/065;H01L21/56;H01L23/31;H01L23/36;H01L23/367;H01L23/538;H01L23/00;H01L23/48;H01L23/498 主分类号 H01L25/065
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A semiconductor device, comprising: a first semiconductor die; a first thermally conductive layer formed over the first semiconductor die; an interconnect structure formed over the first semiconductor die; and a first conductive via formed through the first semiconductor die.
地址 Singapore SG