发明名称 LIQUID CRYSTAL PANEL INSPECTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To inspect a liquid crystal panel with improved detection level and S/N, at high precision. SOLUTION: On a substrate 4, a thin-type array sensor 1 and an amplifier and scanner 2 are provided. In addition, at an end part of the substrate 4, a plurality of step-like notches 6 re formed. With a lead-out electric line 3 formed by metal film forming, an array sensor 2, the amplifier and scanner 2, and the notch 6 are wired together. Since the array sensor 1 and the amplifier and scanner 2 as well as the electric line 3, are thin, the array sensor 1 is allowed to be close to a liquid crystal panel which is to be inspected. Further, through the lead-out electric line 3 of the notch 6, signal is easily taken out.</p>
申请公布号 JPH11153637(A) 申请公布日期 1999.06.08
申请号 JP19970322663 申请日期 1997.11.25
申请人 MITSUBISHI HEAVY IND LTD 发明人 MURAKAWA SHINICHI;SHIMAZU TADASHI;EGASHIRA YOSHIO;ROKKAKU TADASHI
分类号 G01R31/302;G01R31/00;G02F1/1345;G02F1/136;G02F1/1368;(IPC1-7):G01R31/00;G02F1/134 主分类号 G01R31/302
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