发明名称 SPECKLE SHEARING-INTERFEROMETER FOR STRAIN MEASUREMENT
摘要 <p>The signal to noise ratio in non-destructive testing or evaluation of a sample (1) by in phase stepped optical inspection systems such as the optical shearography system using a shearing interferometer involves production of correlated speckle images successively stepped in phase by illuminating with coherent radiation a sample in an unstressed state, illuminating the sample with coherent radiation, stressing it incrementally at predetermined stress increments, and generating and capturing correlated speckle images successively stepped in phase of the incrementally stressed sample at the predetermined stress increments, using the phase stepped speckle images of the unstressed and incrementally stressed sample to calculate the phase before and after stressing and differencing the images to extract the incremental phase change, inspecting the magnitude and sign of each incremental phase change and if the phase difference between successive measurements increases by more than pi subtracting 2 pi from the measurement value or if the phase difference between successive measurements decreases by more than pi adding 2 pi to the measurement value, and calculating the phase at each point in each speckle image by summing the nearest neighbour phase differences in the image that are weighted by the square of their respective modulations, where the modulation is a measure of intensity variation with phase variation and normalising the result of this calculation by dividing by the sum of the modulations.</p>
申请公布号 EP1137908(B1) 申请公布日期 2005.02.23
申请号 EP19990959514 申请日期 1999.12.01
申请人 BAE SYSTEMS PLC 发明人 SALTER, PHILLIP LANGLEY;PARKER, STEVE CARL JAMIESON
分类号 G01B9/02;G01B11/16;(IPC1-7):G01B9/02 主分类号 G01B9/02
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