| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit having a test circuit that allows a user to collect test data at any time. <P>SOLUTION: Among data received by a communication circuit 8 and transferred to a data buffer 19, "header", "address" and "command" data portions are transferred to a test execution part 20 of a test circuit 9. A counter 21 starts a count operation based on a system clock when a "cycle" data portion of the transferred data is transferred. Upon completion of the count operation by the counter 21, the test execution part 20 outputs a decoded result based on the "address", as a collection enable signal, to a testing circuit when the "header" indicates that the transferred data is "for test purpose" and when the "command" is a "data collection instruction". A data buffer 17, when supplied with the collection enable signal, stores the data transferred from the testing circuit. <P>COPYRIGHT: (C)2008,JPO&INPIT |
