发明名称 |
Measuring circuit and reading method for memory cells |
摘要 |
An electronic circuit arrangement includes at least one memory element in which at least two electrical quantities can be stored. A switching unit is electrically connected to the memory element and has at least one first circuit path and a second circuit path. A storage unit has a first partial storage unit and a second partial storage unit. Each partial storage unit is set up for storing at least one electrical quantity. The switching unit is set up in such a way that it can sequentially pass a first one of the at least two electrical quantities along the first circuit path to the first partial storage unit and a second one of the at least two electrical quantities along the second circuit path to the second partial storage unit.
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申请公布号 |
US2007086240(A1) |
申请公布日期 |
2007.04.19 |
申请号 |
US20060542755 |
申请日期 |
2006.10.04 |
申请人 |
KERN THOMAS;MIKOLAJICK THOMAS;SCHLEY JAN-MALTE |
发明人 |
KERN THOMAS;MIKOLAJICK THOMAS;SCHLEY JAN-MALTE |
分类号 |
G11C16/04 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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