发明名称 Measuring circuit and reading method for memory cells
摘要 An electronic circuit arrangement includes at least one memory element in which at least two electrical quantities can be stored. A switching unit is electrically connected to the memory element and has at least one first circuit path and a second circuit path. A storage unit has a first partial storage unit and a second partial storage unit. Each partial storage unit is set up for storing at least one electrical quantity. The switching unit is set up in such a way that it can sequentially pass a first one of the at least two electrical quantities along the first circuit path to the first partial storage unit and a second one of the at least two electrical quantities along the second circuit path to the second partial storage unit.
申请公布号 US2007086240(A1) 申请公布日期 2007.04.19
申请号 US20060542755 申请日期 2006.10.04
申请人 KERN THOMAS;MIKOLAJICK THOMAS;SCHLEY JAN-MALTE 发明人 KERN THOMAS;MIKOLAJICK THOMAS;SCHLEY JAN-MALTE
分类号 G11C16/04 主分类号 G11C16/04
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