发明名称 Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum
摘要 A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
申请公布号 US9404798(B2) 申请公布日期 2016.08.02
申请号 US201414468900 申请日期 2014.08.26
申请人 NEC CORPORATION 发明人 Tomita Hideya
分类号 G01J3/04;G01J3/18 主分类号 G01J3/04
代理机构 Young & Thompson 代理人 Young & Thompson
主权项 1. A control apparatus comprising: a slit plate which includes a plurality of rectangular slits with different widths; an acquisition unit which acquires an incident spectrum from the rectangular slit; and a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
地址 Tokyo JP