发明名称 |
Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum |
摘要 |
A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength. |
申请公布号 |
US9404798(B2) |
申请公布日期 |
2016.08.02 |
申请号 |
US201414468900 |
申请日期 |
2014.08.26 |
申请人 |
NEC CORPORATION |
发明人 |
Tomita Hideya |
分类号 |
G01J3/04;G01J3/18 |
主分类号 |
G01J3/04 |
代理机构 |
Young & Thompson |
代理人 |
Young & Thompson |
主权项 |
1. A control apparatus comprising:
a slit plate which includes a plurality of rectangular slits with different widths; an acquisition unit which acquires an incident spectrum from the rectangular slit; and a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength. |
地址 |
Tokyo JP |